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Automatic Optical Inspection & Measurement

Beginning in 1987, when Takano Image Processing and Measurement Division first released its original brand of image processing inspection equipment, we have striven to continually improve the functionality of our products and expanded the range of applications. Takano now offers an extensive lineup of state-of-the-art products starting IC package inspection system, FPD(flat panel display) inspection system, film inspection system, battery-related material inspection system and measuring systems such as AFM (Automatic Force Microscope) and others.

Main Products

  • LCD AOI (Automatic Optical Inspection)


    The mass-production quality control system used for automatic inspection and defect determination of patterned glass substrate in the manufacturing processes for liquid crystal panels for televisions and smartphones.

  • AFM (Atomic Force Microscope)


    AFM(atomic force microscope) is a high-precision three-dimensional profilometer for measuring film thickness and surface roughness. The system is usable for analysis applications and as a quality control/inspection tool on the manufacturing line.

  • Film Inspection System


    This film inspection system performs high-speed, high-resolution automatic inspection and judgement during roll-to-roll transfer of sheets, films, and metal foils to ensure quality process control.

  • PV Wafer/Cell Crack Inspection System


    This equipment uses a laser beam to rapidly inspect the cracks on and in the solar battery (PV, photo voltaic) wafers and cells. It can also inspect polycrystalline silicon without being interrupted by the grain boundary patterns. This unique inspection system will become an irreplaceable equipment for crack trend control, yield improvement and other process control items.

Takano's capability of systemization offers more than just an inspection,
new technologies for process control

As a total supplier of surface inspection systems, Takano provides customized inspection and measurement systems to meet the production line concepts of customers to support realizing the ideal production process.
Yield improvement and quality control pose very important challenges in today’s manufacturing processes. Accordingly, inspection machine requires system capabilities to control the entire production line. Such system capabilities built on image processing, optics, fine-scale measurement, and system construction, which are the four core technologies Takano has explored and developed as proprietary technologies over the years. In order to meet customer needs, these original technologies enable Takano to provide an extensive array of support ranging from optimal system proposals to modifications and after-sales services for installed equipment.
Takano inspection and measurement systems play active roles in flat panel-related processes and other diverse fields of semiconductors, PCBs, and next generation energy. The strong confidence of our customers provides evidence for the high added value provided by these products. Takano will take on the challenges of continuing to meet customer needs by looking one step ahead into the future.

  • Contact

Takano Co.Ltd. Image Processing & Measurement Division

1-13 Kanda-sudacho, Chiyoda-ku, Tokyo 101-0041
TEL. +81-03-3253-8261

Contact

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